Production of submicrometre fused silica gratings using laser-induced backside dry etching technique

被引:42
作者
Hopp, B.
Vass, Cs
Smausz, T.
Bor, Zs
机构
[1] Hungarian Acad Sci, H-6720 Szeged, Hungary
[2] Univ Szeged, Res Grp Laser Phys, H-6720 Szeged, Hungary
[3] Univ Szeged, Dept Opt & Quantum Elect, H-6720 Szeged, Hungary
关键词
D O I
10.1088/0022-3727/39/22/015
中图分类号
O59 [应用物理学];
学科分类号
摘要
Laser micromachining of transparent materials is a promising technique for producing micro-optical elements. Several types of both direct ( e. g. ablation) and indirect ( e. g. laser-induced backside wet etching: LIBWE) procedures have already been developed and presented in the last two decades. Here we present a new method (laser-induced backside dry etching (LIBDE)) in the analogy of LIBWE for the micro and nanoprocessing of transparent materials. In our experiments 1 mm thick fused silica plates were used as transparent work pieces. The plates were covered with 100 nm thick silver layers. The metal absorbing films were irradiated through the fused silica by a KrF excimer laser beam (lambda = 248 nm, FWHM = 30 ns). The illuminated area was 1.05 mm(2) and the fluence on the silver - quartz interface varied in the range 0 - 1800 mJ cm(-2). We have provided evidence that LIBDE is more effective and simple than LIBWE, its etch rate being much higher at a given laser fluence. Our interference experiments proved that the LIBDE etching technique is suitable to fabricate gratings displaying submicrometre periods in transparent materials. On the basis of all these, it is suggested that this method may be useful to produce other nano and microoptical elements, too.
引用
收藏
页码:4843 / 4847
页数:5
相关论文
共 30 条
[1]   Effects of halogenated organic solvents on laser-induced backside wet etching of fused silica [J].
Böhme, R ;
Zimmer, K .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2006, 83 (01) :9-12
[2]   The influence of the laser spot size and the pulse number on laser-induced backside wet etching [J].
Böhme, R ;
Zimmer, K .
APPLIED SURFACE SCIENCE, 2005, 247 (1-4) :256-261
[3]   Laser backside etching of fused silica due to carbon layer ablation [J].
Böhme, R ;
Zimmer, K ;
Rauschenbach, B .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2006, 82 (02) :325-328
[4]   Topography and roughness evolution of microstructured surfaces at laser-induced backside wet etching [J].
Böhme, R ;
Zajadacz, J ;
Zimmer, K ;
Rauschenbach, B .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 80 (02) :433-438
[5]   Surface characterization of backside-etched transparent dielectrics [J].
Böhme, R ;
Spemann, D ;
Zimmer, K .
THIN SOLID FILMS, 2004, 453 :127-132
[6]   Backside etching of UV-transparent materials at the interface to liquids [J].
Böhme, R ;
Braun, A ;
Zimmer, K .
APPLIED SURFACE SCIENCE, 2002, 186 (1-4) :276-281
[7]   Laser-induced back-side wet etching of fused silica with an aqueous solution containing organic molecules [J].
Ding, X ;
Yasui, Y ;
Kawaguchi, Y ;
Niino, H ;
Yabe, A .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 75 (03) :437-440
[8]   Laser-induced high-quality etching of fused silica using a novel aqueous medium [J].
Ding, X ;
Kawaguchi, Y ;
Niino, H ;
Yabe, A .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 75 (06) :641-645
[9]   Fabrication of microarrays on fused silica plates using the laser-induced backside wet etching method [J].
Ding, XM ;
Kawaguchi, Y ;
Sato, T ;
Narazaki, A ;
Niino, H .
LANGMUIR, 2004, 20 (22) :9769-9774
[10]   Laser-induced backside wet etching of sapphire [J].
Ding, XM ;
Sato, T ;
Kawaguchi, Y ;
Niino, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (2B) :L176-L178