Microstructure and morphology evolution in chemically deposited semiconductor films: 4. From isolated nanoparticles to monocrystalline PbS thin films on GaAs(100) substrates

被引:42
作者
Osherov, A. [1 ]
Ezersky, V.
Golan, Y.
机构
[1] Ben Gurion Univ Negev, Dept Mat Engn, IL-84105 Beer Sheva, Israel
[2] Ben Gurion Univ Negev, Ilse Katz Ctr Nanosci & Nanotechnol, IL-84105 Beer Sheva, Israel
关键词
D O I
10.1051/epjap:2006151
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin lead sulfide films were grown on single crystal GaAs(100) substrates by chemical deposition using Pb(NO3)(2) and CS(NH2)(2) with excess of NaOH in aqueous solution at a range of deposition temperatures 0-50 degrees C. The microstructure and morphology evolution were studied as a function of the deposition conditions, resulting in a wide range of microstructures. Ultrahigh resolution scanning electron microscopy and atomic force microscopy indicated a systematic change in particle shape and surface morphology as a function of deposition temperature and deposition time. X-ray diffraction of 200-500 nm thick films indicated a dominant < 110 > texture throughout the deposition temperature range. At deposition temperatures above 40 degrees C, single crystal films were obtained. Cross-sectional transmission electron microscopy analyses showed a unique (011)(PbS)||(100)(GaAs) and [100](PbS)||[011](GaAs) orientation relationship.
引用
收藏
页码:39 / 47
页数:9
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