Frequency stability of dielectric loaded HTS microwave resonators

被引:8
作者
Gallop, J
Hao, L
Abbas, F
Langham, CD
机构
[1] National Physical Laboratory
关键词
D O I
10.1109/77.622149
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High Q dielectric loaded superconducting resonators have many potential microwave applications. A key issue for many of these is the stability with which the resonant frequencies of such resonators may be realised, Sor use as frequency references etc. We report experiments on a number of different resonator geometries using YBCO thick films as planar shields for composite dielectric structures. The experimental results are analysed and surface impedance data as a function of temperature and frequency is deduced for each superconductor specimen as well as real and imaginary components of fl-ie relative permittivity of each dielectric material involved in the resonators. Using these parameters predictions are made for the attainable stability in realistic resonator structures. We compare these predictions with stability requirements for a number of wide ranging and niche applications.
引用
收藏
页码:3504 / 3507
页数:4
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