Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction

被引:100
作者
Hillenbrand, R [1 ]
Stark, M [1 ]
Guckenberger, R [1 ]
机构
[1] Max Planck Inst Biochem, Abt Mol Strukturbiol, D-82152 Martinsried, Germany
关键词
D O I
10.1063/1.126683
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present an experimental analysis of the nonlinear tip-sample interaction in tapping-mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever motion. Two aspects of a concept aiming at a full reconstruction of the tip-sample interaction are demonstrated: higher flexural eigenmode vibrations excited by the impact of the oscillating tip on the sample are used to measure the tip-sample interaction time: by imaging at higher harmonics of the driving frequency material contrast is obtained. (C) 2000 American Institute of Physics. [S0003-6951(00)03823-7].
引用
收藏
页码:3478 / 3480
页数:3
相关论文
共 17 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[3]   Friction anisotropy and asymmetry of a compliant monolayer induced by a small molecular tilt [J].
Liley, M ;
Gourdon, D ;
Stamou, D ;
Meseth, U ;
Fischer, TM ;
Lautz, C ;
Stahlberg, H ;
Vogel, H ;
Burnham, NA ;
Duschl, C .
SCIENCE, 1998, 280 (5361) :273-275
[4]   Phase imaging and stiffness in tapping-mode atomic force microscopy [J].
Magonov, SN ;
Elings, V ;
Whangbo, MH .
SURFACE SCIENCE, 1997, 375 (2-3) :L385-L391
[5]   Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy [J].
Miyatani, T ;
Horii, M ;
Rosa, A ;
Fujihira, M ;
Marti, O .
APPLIED PHYSICS LETTERS, 1997, 71 (18) :2632-2634
[6]   ACOUSTIC MICROSCOPY BY ATOMIC-FORCE MICROSCOPY [J].
RABE, U ;
ARNOLD, W .
APPLIED PHYSICS LETTERS, 1994, 64 (12) :1493-1495
[7]   Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment [J].
Rabe, U ;
Janser, K ;
Arnold, W .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (09) :3281-3293
[8]   Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation [J].
Sarid, D ;
Ruskell, TG ;
Workman, RK ;
Chen, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :864-867
[9]   Tapping scanning force microscopy in air-theory and experiment [J].
Spatz, JP ;
Sheiko, S ;
Moller, M ;
Winkler, RG ;
Reineker, P ;
Marti, O .
LANGMUIR, 1997, 13 (17) :4699-4703
[10]   Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation [J].
Stark, RW ;
Heckl, WM .
SURFACE SCIENCE, 2000, 457 (1-2) :219-228