Investigation of aerosol particles by atomic force microscopy

被引：18

作者：

Kollensperger, G

Friedbacher, G

Grasserbauer, M

Dorffner, L

机构：

[1] VIENNA TECH UNIV,INST ANALYT CHEM,A-1060 VIENNA,AUSTRIA

[2] VIENNA TECH UNIV,INST PHOTOGRAMMETRIE & FERNERKUNDUNG,A-1040 VIENNA,AUSTRIA

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1997年 / 358卷 / 1-2期

关键词：

D O I：

10.1007/s002160050403

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

AFM has been applied for studying morphology and size distribution of nanometer-sized particles adsorbed on flat surfaces. In order to optimize imaging of these ultrafine particles different substrates were evaluated with respect to their roughness and stability under tile influence of the sensing tip. Moreover, a method for calculating particle volumes from the three-dimensional AFM data is described. This greatly enhances the information content of AFM images, because a large number of particles in the raw data call be evaluated automatically in order to derive information on size distribution or surface coverage. This evaluation method has also been applied successfully to quantitatively describe changes on particles induced by different humidity of the surrounding atmosphere.

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收藏

页码：268 / 273

页数：6

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