INVESTIGATION OF ENVIRONMENTAL AEROSOL BY ATOMIC-FORCE MICROSCOPY

被引:29
作者
FRIEDBACHER, G [1 ]
GRASSERBAUER, M [1 ]
MESLMANI, Y [1 ]
KLAUS, N [1 ]
HIGATSBERGER, MJ [1 ]
机构
[1] UNIV VIENNA,INST EXPTL PHYS,A-1090 VIENNA,AUSTRIA
关键词
D O I
10.1021/ac00106a016
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
We have been successful in imaging environmental aerosol particles by atomic force microscopy (AFM). The material under investigation was rural aerosol collected with an 11-stage low-pressure impactor. On polyester substrates, particles smaller than 20 mn could be observed. From the AFM data, size distributions have been determined and compared with the expected performance of the used cascade impactor. The mean particle sizes (aerodynamic equivalent diameter) were in good agreement with the values derived from AFM experiments. Moreover, we have obtained atomically resolved images on single aerosol particles; to our knowledge, this is the first time this has been accomplished on environmental samples. AFM images of larger impactor stages showed good agreement with light and electron microscopy micrographs.
引用
收藏
页码:1749 / 1754
页数:6
相关论文
共 26 条
[1]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[4]   SCANNING TUNNELING MICROSCOPY OF SPUTTERED ALUMINUM PARTICLES [J].
KAISER, B ;
SATTLER, K ;
MULLER, U ;
VENKATESWARAN, N ;
XHIE, J ;
RAINA, G .
ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS, 1991, 19 (1-4) :323-325
[5]  
KLAUS N, 1985, STAUB REINHALT LUFT, V45, P168
[6]   STRUCTURE OF PLATINUM ULTRAFINE PARTICLES IN PT/C CATALYST OBSERVED BY SCANNING TUNNELING MICROSCOPY [J].
KOMIYAMA, M ;
KOBAYASHI, J ;
MORITA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :608-609
[7]  
LINDGREEN H, 1991, AM MINERAL, V76, P1218
[8]   SURFACE CHARACTERIZATION OF MATERIALS AT AMBIENT CONDITIONS BY SCANNING-TUNNELING-MICROSCOPY (STM) AND ATOMIC FORCE MICROSCOPY (AFM) [J].
MAGONOV, SN .
APPLIED SPECTROSCOPY REVIEWS, 1993, 28 (1-2) :1-121
[9]  
MESLMANI Y, 1994, THESIS U VIENNA VIEN
[10]   CORRECTION [J].
MEYER, G .
APPLIED PHYSICS LETTERS, 1988, 53 (24) :2400-2400