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SURFACE CHARACTERIZATION OF MATERIALS AT AMBIENT CONDITIONS BY SCANNING-TUNNELING-MICROSCOPY (STM) AND ATOMIC FORCE MICROSCOPY (AFM)

被引：46
作者：
MAGONOV, SN
机构：
[1] Materials Research Center (F.M.F) of the, Alberts-Ludwig University, W-7800 Freiburg
来源：
APPLIED SPECTROSCOPY REVIEWS | 1993年 / 28卷 / 1-2期
关键词：
D O I：
10.1080/05704929308021499
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
引用
收藏
页码：1 / 121
页数：121
相关论文
共 151 条
  • [1] THEORETICAL INTERPRETATION OF ATOMIC-FORCE-MICROSCOPE IMAGES OF GRAPHITE
    ABRAHAM, FF
    BATRA, IP
    [J]. SURFACE SCIENCE, 1989, 209 (1-2) : L125 - L132
  • [2] EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY
    ABRAHAM, FF
    BATRA, IP
    CIRACI, S
    [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (13) : 1314 - 1317
  • [3] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY
    ALBRECHT, TR
    QUATE, CF
    [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602
  • [4] IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY
    ALBRECHT, TR
    DOVEK, MM
    LANG, CA
    GRUTTER, P
    QUATE, CF
    KUAN, SWJ
    FRANK, CW
    PEASE, RFW
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) : 1178 - 1184
  • [5] AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER
    ALEXANDER, S
    HELLEMANS, L
    MARTI, O
    SCHNEIR, J
    ELINGS, V
    HANSMA, PK
    LONGMIRE, M
    GURLEY, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) : 164 - 167
  • [6] ATOMIC-SCALE IMAGING OF ANISOTROPIC ORGANIC CONDUCTORS BY SCANNING PROBE TECHNIQUES (STM/AFM)
    BAR, G
    MAGONOV, SN
    CANTOW, HJ
    GMEINER, J
    SCHWOERER, M
    [J]. ULTRAMICROSCOPY, 1992, 42 : 644 - 652
  • [7] BAR G, 1993, UNPUB J AM CHEM SOC
  • [8] BAR G, 1991, SYNTHETIC MET, V41, P2335
  • [9] BAR G, 1992, IN PRESS SOLID STATE
  • [10] BAR G, 1992, POLYM PREPR, V33, P777
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