Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

被引：185

作者：

Bonnell, D. A. ^{[1
]}

Kalinin, S. V. ^{[2
]}

Kholkin, A. L. ^{[3
]}

Gruverman, A. ^{[4
]}

机构：

[1] Univ Penn, Philadelphia, PA 19104 USA

[2] Oak Ridge Natl Lab, Oak Ridge, TN 37922 USA

[3] Univ Aveiro, Aveiro, Portugal

[4] Univ Nebraska, Lincoln, NE 68588 USA

来源：

MRS BULLETIN | 2009年 / 34卷 / 09期

关键词：

THIN-FILMS; FERROELECTRIC SURFACES; ULTRAHIGH DENSITY; PROBE MICROSCOPY; LOCAL REACTIVITY; POLARIZATION; NUCLEATION; PIEZOELECTRICITY; HYSTERESIS; ADSORPTION;

D O I：

10.1557/mrs2009.176

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

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页码：648 / 657

页数：10

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