Formation of sputtered silver clusters under bombardment with SF5+ ions

被引:7
作者
Ghalab, S
Staudt, C
Maksimov, SE
Marsarov, P
Tugushev, VI
Dzhemilev, NK
Wucher, A [1 ]
机构
[1] Univ Essen Gesamthsch, Inst Expt Phys, D-45117 Essen, Germany
[2] Arifov Inst Elect, Cluster Phys Lab, Tashkent 700125, Uzbekistan
关键词
D O I
10.1016/S0168-583X(02)01361-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The formation of Ag-n clusters and Ag-n(+) cluster ions under bombardment of a silver surface with SF5+ and Xe+ projectile ions was investigated experimentally. In order to obtain information about the relative abundance of clusters among the flux of sputtered particles independent of their charge state, mass spectra of both secondary ions and sputtered neutral particles were recorded. The neutral species were post-ionized prior to mass analysis by means of photo-ionization using an intense UN laser at a wavelength of 193 nm. It is found that measured Ag-n(+) signals increase significantly if SF5+ projectiles are used instead of rare gas (Ar+ or Xe+) ions of the same kinetic impact energy. The 5 signals of neutral Ag atoms and Ag-n clusters, on the other hand, exhibit oily a relatively small increase, thus indicating that the enhancement observed for the secondary ions is predominantly caused by an increased ionization probability of sputtered particles under SF5+ bombardment rather than by enhanced partial sputtering yields. While the transition 5 from Ar+ to Xe+ projectiles leads to a drastic increase of the relative abundance of larger clusters in the spectrum, practically no such effect can be detected for the transition from Ar+ to SF5+. This finding shows that the use of 5 polyatomic SF5 projectiles does not lead to a higher efficiency in producing sputtered clusters. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:43 / 48
页数:6
相关论文
共 22 条
[1]  
Andersen H. H., 1981, Sputtering by particle bombardment I. Physical sputtering of single-element solids, P145
[2]  
[Anonymous], SECONDARY ION MASS S
[3]   FOCUSED, RASTERABLE, HIGH-ENERGY NEUTRAL MOLECULAR-BEAM PROBE FOR SECONDARY ION MASS-SPECTROMETRY [J].
APPELHANS, AD ;
DELMORE, JE ;
DAHL, DA .
ANALYTICAL CHEMISTRY, 1987, 59 (13) :1685-1691
[4]   ION MICROPROBE FOR STUDYING CLUSTER ION DECAY REACTIONS [J].
BEKKERMAN, AD ;
DZHEMILEV, NK ;
ROTSTEIN, VM .
SURFACE AND INTERFACE ANALYSIS, 1990, 15 (10) :587-590
[5]   Nonlinear effects in cluster emission from solids induced by molecular ion impact [J].
Belykh, SF ;
Bitensky, IS ;
Mullajanov, D ;
Rasulev, UK .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 129 (04) :451-458
[6]   Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment [J].
Belykh, SF ;
Habets, B ;
Rasulev, UK ;
Samartsev, AV ;
Stroev, LV ;
Veryovkin, IV .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 164 :809-819
[7]  
BELYKH SF, 1998, SIMS, V11, P957
[8]   NEW FINDINGS ON THE SPUTTERING OF NEUTRAL METAL-CLUSTERS [J].
COON, SR ;
CALAWAY, WF ;
PELLIN, MJ ;
WHITE, JM .
SURFACE SCIENCE, 1993, 298 (01) :161-172
[9]   NEUTRAL COPPER CLUSTER SPUTTERING YIELDS - NE+, AR+ AND XE+ BOMBARDMENT [J].
COON, SR ;
CALAWAY, WF ;
PELLIN, MJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 90 (1-4) :518-522
[10]  
HAGENHOFF B, 1998, SECONDARY ION MASS S, V11, P585