ION MICROPROBE FOR STUDYING CLUSTER ION DECAY REACTIONS

被引：16

作者：

BEKKERMAN, AD ^{[1
]}

DZHEMILEV, NK ^{[1
]}

ROTSTEIN, VM ^{[1
]}

机构：

[1] UA ARIFOV ELECT ENGN INST,TASHKENT 700143,UZBEKISTAN,USSR

来源：

SURFACE AND INTERFACE ANALYSIS | 1990年 / 15卷 / 10期

关键词：

D O I：

10.1002/sia.740151003

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In the present paper, an ion microprobe is used to study the fragmentation regularities of Aln+ and Sin+ cluster ions sputtered under ion bombardment. The results have shown that the ions formed during cluster fragmentation, along the path from the target to the detector, transform the mass spectra of both charged and neutral components and the energy distribution of the parent cluster and monomer ions. Copyright © 1990 John Wiley & Sons Ltd.

引用

页码：587 / 590

页数：4

共 11 条

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