Electronic structure and optical behavior of self-assembled InAs quantum dots

被引:9
作者
Berryman, KW
Lyon, SA
Segev, M
机构
[1] Department of Electrical Engineering, Princeton University, Princeton
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 04期
关键词
D O I
10.1116/1.589390
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using both electrical and optical techniques, ground state energy levels and excited states of carriers in self-assembled InAs quantum dots are described, and the first observations of mid-infrared photoconductivity in these structures are presented. Electrical measurements including ac conductance and Hall techniques have been used to determine thermal trapping of carriers, and yield strong binding for holes, less binding for electrons, and an exciton energy that is consistent with photoluminescence (PL) measurements. Further PL experiments have probed the effect of changing the InAs dot size, and using embedding material of different composition. Several of these structures also demonstrate strong electron binding. In devices where the InAs dots have been grown in an Al(0.3)Ga(0.7)As matrix and surrounded by AlAs barriers, normal incidence photoconductivity has been observed at a range of wavelengths in the mid-infrared and attributed to single carrier transitions out of the dots. This mid-infrared optical response is investigated for several different dot structures and compared to photoluminescence data from the same samples. (C) 1997 American Vacuum Society.
引用
收藏
页码:1045 / 1050
页数:6
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