Dielectric properties of pulsed-laser-deposited calcium titanate thin films

被引：63

作者：

Hao, JH

Si, WD

Xi, XX ^{[1
]}

Guo, RY

Bhalla, AS

Cross, LE

机构：

[1] Penn State Univ, Dept Phys, University Pk, PA 16802 USA

[2] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 21期

关键词：

D O I：

10.1063/1.126536

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have deposited CaTiO3 thin films on SrRuO3 electrode layers on SrTiO3 and LaAlO3 substrates by pulsed laser deposition. The low-frequency dielectric properties were measured from 4 to 300 K. We found that the dielectric constants of 1-mu m-thick CaTiO3 films are very close to that observed in the bulk materials. The dielectric loss depends on the temperature and is on the order of 10(-4) at low temperature. The dielectric constants of the films can be tuned by electric field by 6% at room temperature and 10% at 200 K. (C) 2000 American Institute of Physics. [S0003- 6951(00)01321-8].

引用

页码：3100 / 3102

页数：3

共 14 条

[11] Soft-mode hardening in SrTiO3 thin films [J].