Temperature dependence of electron spin resonance in fluorinated amorphous carbon films

被引:15
作者
Yokomichi, H
Morigaki, K
机构
[1] Toyama Prefectural Univ, Dept Elect & Informat, Fac Engn, Toyama 9390398, Japan
[2] Hiroshima Inst Technol, Dept Elect Engn, Saeki Ku, Hiroshima 7315193, Japan
关键词
D O I
10.1016/S0022-3093(00)00020-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electron spin resonance (ESR) measurements were carried out at 9.2 GHz in the temperature range between 5 and 300 K on fluorinated amorphous carbon (a-C:F) films prepared by plasma chemical vapor deposition (CVD) with different fluorine concentrations and dangling bond densities. The observed temperature dependences of the line width are interpreted in terms of motional narrowing due to hopping motion of dangling bond electrons and also surrounding fluorine motion, taking into account that the original line broadening arises from hyperfine splitting due to surrounding fluorine nuclei. From the temperature dependences of the line width, we conclude that several types of dangling bond centers with different environments are present with different relative densities among a-C:F samples. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:797 / 802
页数:6
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