Synthesis, characterization and optical properties of Eu2O3 mesoporous thin films

For the first time, nanocrystalline Eu2O3 thin films, exhibiting similar to 50% of porous volume, highly accessible mesoporosity, pore diameter of about 10 nm, and thermal stability up to 830 degrees C, were prepared using the evaporation-induced self-assembly ( EISA) process from europium ( III) chloride and specific polyethylene oxide based copolymer structuring agent. Crystallization of the inorganic network was achieved through a controlled thermal treatment sequence that was followed by in situ time-resolved SAXS/WAXS analysis involving synchrotron radiation. Atomic force microscopy ( AFM) and x-ray diffraction ( XRD) were used to complete the characterization of the crystallization of the film. Porous structures were additionally analysed by transmission electron microscopy ( TEM), and environmental ellipsometry porosimetry ( EEP), while the composition of the films was characterized by Rutherford back-scattering ( RBS). Finally, the luminescence properties of these layers were investigated.