Chemistry-induced intrinsic stress variations during the chemical vapor deposition of polycrystalline diamond

被引:13
作者
Rajamani, A [1 ]
Sheldon, BW
Nijhawan, S
Schwartzman, A
Rankin, J
Walden, BL
Riester, L
机构
[1] Brown Univ, Div Engn, Providence, RI 02912 USA
[2] Trinity Coll, Dept Phys, Hartford, CT 06106 USA
[3] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1777811
中图分类号
O59 [应用物理学];
学科分类号
摘要
Intrinsic tensile stresses in polycrystalline films are often attributed to the coalescence of neighboring grains during the early stages of film growth, where the energy decrease associated with converting two free surfaces into a grain boundary provides the driving force for creating tensile stress. Several recent models have analyzed this energy trade off to establish relationships between the stress and the surface/interfacial energy driving force, the elastic properties of the film, and the grain size. To investigate these predictions, experiments were conducted with diamond films produced by chemical vapor deposition. A multistep processing procedure was used to produce films with significant variations in the tensile stress, but with essentially identical grain sizes. The experimental results demonstrate that modest changes in the deposition chemistry can lead to significant changes in the resultant tensile stresses. Two general approaches were considered to reconcile this data with existing models of stress evolution. Geometric effects associated with the shape of the growing crystal were evaluated with a finite element model of stress evolution, and variations in the surface/interfacial energy driving force were assessed in terms of both chemical changes in the deposition atmosphere and differences in the crystal growth morphology. These attempts to explain the experimental results were only partially successful, which suggests that other factors probably affect intrinsic tensile stress evolution due to grain boundary formation. (C) 2004 American Institute of Physics.
引用
收藏
页码:3531 / 3539
页数:9
相关论文
共 38 条
[1]   THE INTERNAL-STRESS IN THIN SILVER, COPPER AND GOLD-FILMS [J].
ABERMANN, R ;
KOCH, R .
THIN SOLID FILMS, 1985, 129 (1-2) :71-78
[2]   Point defect incorporation during diamond chemical vapor deposition [J].
Battaile, CC ;
Srolovitz, DJ ;
Butler, JE .
JOURNAL OF MATERIALS RESEARCH, 1999, 14 (08) :3439-3446
[3]   ELECTRON SPECTROSCOPIC IDENTIFICATION OF CARBON SPECIES FORMED DURING DIAMOND GROWTH [J].
BELTON, DN ;
SCHMIEG, SJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :2353-2362
[4]   Monitoring stress in thin films during processing [J].
Chason, E ;
Sheldon, BW .
SURFACE ENGINEERING, 2003, 19 (05) :387-391
[5]   Intrinsic stress and its relaxation in diamond film deposited by hot filament chemical vapor deposition [J].
Choi, SK ;
Jung, DY ;
Choi, HM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1996, 14 (01) :165-169
[6]   EFFECTS OF TEMPERATURE AND FILAMENT POISONING ON DIAMOND GROWTH IN HOT-FILAMENT REACTORS [J].
DANDY, DS ;
COLTRIN, ME .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (05) :3102-3113
[7]   Nanoindentation of CVD diamond:: comparison of an FE model with analytical and experimental data [J].
De Fazio, L ;
Syngellakis, S ;
Wood, RJK ;
Fugiuele, FM ;
Sciumé, G .
DIAMOND AND RELATED MATERIALS, 2001, 10 (3-7) :765-769
[8]   ORIGINS OF STRESS IN THIN NICKEL FILMS [J].
DOLJACK, FA ;
HOFFMAN, RW .
THIN SOLID FILMS, 1972, 12 (01) :71-&
[9]   The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films [J].
Floro, JA ;
Hearne, SJ ;
Hunter, JA ;
Kotula, P ;
Chason, E ;
Seel, SC ;
Thompson, CV .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (09) :4886-4897
[10]   Surface migration in diamond growth [J].
Frenklach, M ;
Skokov, S .
JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (16) :3025-3036