Chemical characterization using relative intensity of manganese Kβ′ and Kβ5 X-ray fluorescence

被引:33
作者
Sakurai, K [1 ]
Eba, H [1 ]
机构
[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan
关键词
X-ray fluorescence; trace element analysis; chemical effects; intensity change; undulator radiation; synchrotron radiation; Johansson-type spectrometer; wavelength dispersive; detection efficiency; energy resolution;
D O I
10.1016/S0168-583X(02)01414-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-ray fluorescence can be used not only for the identification/quantification of elements but also for chemical speciation. The present paper demonstrates the potential feasibility of Kbeta spectra measured with a middle energy resolution around similar to10 eV at 6-8 keV, with the main idea being the efficient detection of intensity changes of Kbeta' and Kbeta(5) rather than precise measurements of energy shifts that require high energy-resolution. The experiments were performed at BL40XU, SPring-8, with quasi-monochromatic X-rays (fundamental peak 10.0 keV). Manganese Kbeta spectra were collected using a spectrometer with a Ge(220) Johansson analyzing crystal (R = 120 mm). Since spectral changes were clearly observed, the integrated intensities of Kbeta' and Kbeta(5) lines were normalized by Kbeta(1.3) in order to compare the profiles of the spectra for a number of samples. It has been found that chemical species are suitably classified in the map of Kbeta'-Kbeta(5) relative intensity. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:391 / 395
页数:5
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