Carbon-nanotube tip for highly-reproducible imaging of deoxyribonucleic acid helical turns by noncontact atomic force microscopy

被引:53
作者
Uchihashi, T
Choi, N
Tanigawa, M
Ashino, M
Sugawara, Y
Nishijima, H
Akita, S
Nakayama, Y
Tokumoto, H
Yokoyama, K
Morita, S
Ishikawa, M
机构
[1] ATP, JRCAT, Tsukuba, Ibaraki 3050046, Japan
[2] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan
[3] Natl Inst Adv Interdisciplinary Res, NAIR, JRCAT, Tsukuba, Ibaraki 3058562, Japan
[4] Osaka Univ, Grad Sch Engn, Dept Elect Engn, Suita, Osaka 5650871, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2000年 / 39卷 / 8B期
关键词
carbon nanotube; noncontact-mode atomic force microscopy; tip; DNA; high-resolution imaging; ultrahigh vacuum;
D O I
10.1143/JJAP.39.L887
中图分类号
O59 [应用物理学];
学科分类号
摘要
A carbon nanotube (CNT) was used as a tip for a noncontact-mode atomic force microscope (NC-AFM). A CNT tip was attached to an Au/Si tip by a well-controlled procedure in a scanning-electron-microscope (SEM) chamber. The NC-AFM with the CNT tip produced highly reproducible images of right-handed helical turns of linear droxyribonucleic acid (DNA) with a spacing of 3.5 +/- 1.0 nm. The full-width at half-maximum (FWHM) of the cross section of DNA measured was 3.1 +/- 0.6 nm.
引用
收藏
页码:L887 / L889
页数:3
相关论文
共 19 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip [J].
Choi, N ;
Uchihashi, T ;
Nishijima, H ;
Ishida, T ;
Mizutani, W ;
Akita, S ;
Nakayama, Y ;
Ishikawa, M ;
Tokumoto, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B) :3707-3710
[3]   Nanotubes as nanoprobes in scanning probe microscopy [J].
Dai, HJ ;
Hafner, JH ;
Rinzler, AG ;
Colbert, DT ;
Smalley, RE .
NATURE, 1996, 384 (6605) :147-150
[4]   LARGE-SCALE SYNTHESIS OF CARBON NANOTUBES [J].
EBBESEN, TW ;
AJAYAN, PM .
NATURE, 1992, 358 (6383) :220-222
[5]   ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].
GIESSIBL, FJ .
SCIENCE, 1995, 267 (5194) :68-71
[6]   REPRODUCIBLE IMAGING AND DISSECTION OF PLASMID DNA UNDER LIQUID WITH THE ATOMIC FORCE MICROSCOPE [J].
HANSMA, HG ;
VESENKA, J ;
SIEGERIST, C ;
KELDERMAN, G ;
MORRETT, H ;
SINSHEIMER, RL ;
ELINGS, V ;
BUSTAMANTE, C ;
HANSMA, PK .
SCIENCE, 1992, 256 (5060) :1180-1184
[7]   APPLICATIONS FOR ATOMIC-FORCE MICROSCOPY OF DNA [J].
HANSMA, HG ;
LANEY, DE ;
BEZANILLA, M ;
SINSHEIMER, RL ;
HANSMA, PK .
BIOPHYSICAL JOURNAL, 1995, 68 (05) :1672-1677
[8]  
KITAMURA S, 1995, JPN J APPL PHYS PT 1, V34, P145
[9]   Observation of single- and double-stranded DNA using non-contact atomic force microscopy [J].
Maeda, Y ;
Matsumoto, T ;
Kawai, T .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :400-405
[10]   Carbon-nanotube tips for scanning probe microscopy: Preparation by a controlled process and observation of deoxyribonucleic acid [J].
Nishijima, H ;
Kamo, S ;
Akita, S ;
Nakayama, Y ;
Hohmura, KI ;
Yoshimura, SH ;
Takeyasu, K .
APPLIED PHYSICS LETTERS, 1999, 74 (26) :4061-4063