Dynamics of nanoscale polarization backswitching in tetragonal lead zirconate titanate thin film

被引：40

作者：

Fu, DS

Suzuki, K

Kato, K

Suzuki, H

机构：

[1] Natl Inst Adv Ind Sci & Technol, Moriyama Ku, Nagoya, Aichi 4638560, Japan

[2] Shizuoka Univ, Dept Mat Sci, Hamamatsu, Shizuoka 4328561, Japan

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 13期

关键词：

D O I：

10.1063/1.1565502

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The dynamics of polarization backswitching in highly oriented Pb(Zr0.3Ti0.7)O-3 (PZT) thin films has been studied in nanoscale using piezoresponse scanning force microscopy (SFM). Our measurements reveal that a SFM-written domain with diameter about 200 nm in PZT films loses its polarization through both the sidewise and forward backswitching. Both of these sidewise and forward domain wall motions follow a stretched exponential law. However, the characteristic time tau of forward backswitching are about ten times of that sidewise motion. The time dependence of sidewise domain wall velocity indicates that there is a time dependence of activation energy of the barrier that domain motions encounter. (C) 2003 American Institute of Physics.

引用

页码：2130 / 2132

页数：3

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