Large area nanoimprint fabrication of sub-100 nm interdigitaded metal arrays

被引:11
作者
Montelius, L [1 ]
Heidari, B [1 ]
Graczyk, M [1 ]
Ling, T [1 ]
Maximov, I [1 ]
Sarwe, EL [1 ]
机构
[1] Univ Lund, Div Solid State Phys, S-22100 Lund, Sweden
来源
EMERGING LITHOGRAPHIC TECHNOLOGIES IV | 2000年 / 3997卷
关键词
nanoimprint; interdigitated; nanostructuring; sensors; admittance; lithography;
D O I
10.1117/12.390081
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanoimprint lithography over 2 inch wafers with a patterned area of 40 000 mu m(2) consisting of interdigitated lines of 100 nm width with varying distance between the lines has been performed. By performing metal lift-off and subsequent UV-lithography for definition of contact regions and pads, complete metal arrays have been fabricated. The structure is electrically characterized by admittance spectroscopy. In this paper we describe the design and realization of a compact nanoimprint lithography system. Furthermore, various aspects of nanoimprint lithography are discussed, and nanoimprint lithography is compared with other nanostructuring technologies.
引用
收藏
页码:442 / 452
页数:11
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