STM study of the atomic contact between metallic electrodes

被引:31
作者
Sirvent, C
Rodrigo, JG
Agrait, N
Vieira, S
机构
[1] Laboratorio de Bajas Temperaturas, Depto. Fis. de la Materia Condensada, C-III Univ. Auton. de Madrid
来源
PHYSICA B | 1996年 / 218卷 / 1-4期
关键词
D O I
10.1016/0921-4526(95)00603-6
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A scanning tunneling microscope is used to investigate the phenomenon of the jump to contact between atomic size metalic surfaces. A statistical analysis of the conductance steps in atomic size gold contacts for different temperatures is performed.
引用
收藏
页码:238 / 241
页数:4
相关论文
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