A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

被引：6

作者：

He, Haifeng ^{[1
]}

Nelson, Chris

机构：

[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

ULTRAMICROSCOPY | 2007年 / 107卷 / 4-5期

关键词：

diffractive imaging; STEM; electron optics;

D O I：

10.1016/j.ultramic.2006.09.002

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：340 / 344

页数：5

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