EUV interferometry of a four-mirror ring-field EUV optical system

被引:10
作者
Goldberg, KA [1 ]
Naulleau, P [1 ]
Batson, PJ [1 ]
Denham, P [1 ]
Anderson, EH [1 ]
Bokor, J [1 ]
Chapman, HN [1 ]
机构
[1] Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
来源
EMERGING LITHOGRAPHIC TECHNOLOGIES IV | 2000年 / 3997卷
关键词
interferometry; extreme ultraviolet lithography; EUV; point-diffraction interferometer; at-wavelength testing;
D O I
10.1117/12.390045
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
At-wavelength, extreme ultraviolet interferometric measurements of a new, four-mirror, ring-field projection optical system have been made. Designed for operation at 13.4-nm wavelength with a 0.1 numerical aperture and a 26 mm field of view at the wafer, the nearly diffraction-limited wavefront quality of the system has been verified interferometrically. After assembly and alignment with visible-light interferometry, the optic was transported to Lawrence Berkeley National Laboratory where the at-wavelength testing with a phase-shifting point diffraction interferometer was performed. Measurement of the system wavefront at a number of points across the field of view reveals the optical performance of the system over its large, ring-field imaging area.
引用
收藏
页码:867 / 873
页数:7
相关论文
共 14 条
[1]   Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions [J].
Attwood, DT ;
Naulleau, P ;
Goldberg, KA ;
Tejnil, E ;
Chang, C ;
Beguiristain, R ;
Batson, P ;
Bokor, J ;
Gullikson, EM ;
Koike, M ;
Medecki, H ;
Underwood, JH .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1999, 35 (05) :709-720
[2]   FRINGE-PATTERN ANALYSIS USING A 2-D FOURIER-TRANSFORM [J].
BONE, DJ ;
BACHOR, HA ;
SANDEMAN, RJ .
APPLIED OPTICS, 1986, 25 (10) :1653-1660
[3]   A rigorous method for compensation selection and alignment of microlithographic optical systems [J].
Chapman, HN ;
Sweeney, DW .
EMERGING LITHOGRAPHIC TECHNOLOGIES II, 1998, 3331 :102-113
[4]   VECTOR FORMULATION FOR INTERFEROGRAM SURFACE FITTING [J].
FISCHER, DJ ;
OBRYAN, JT ;
LOPEZ, R ;
STAHL, HP .
APPLIED OPTICS, 1993, 32 (25) :4738-4743
[5]  
Goldberg K.A, 1997, THESIS U CALIFORNIA
[6]  
Goldberg K. A., 1999, TRENDS OPTICS PHOTON, V24
[7]   Extreme ultraviolet interferometric measurements of diffraction-limited optics [J].
Goldberg, KA ;
Naulleau, P ;
Bokor, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06) :2982-2986
[8]   Direct comparison of EUV and visible-light interferometries [J].
Goldberg, KA ;
Naulleau, P ;
Lee, S ;
Chang, C ;
Bresloff, C ;
Gaughan, R ;
Chapman, HN ;
Goldsmith, J ;
Bokor, J .
EMERGING LITHOGRAPHIC TECHNOLOGIES III, PTS 1 AND 2, 1999, 3676 :635-642
[9]   Phase-shifting point diffraction interferometer [J].
Medecki, H ;
Tejnil, E ;
Goldberg, KA ;
Bokor, J .
OPTICS LETTERS, 1996, 21 (19) :1526-1528
[10]  
Medecki H., 1998, US Patent, Patent No. [5,835,217, 5835217]