Surface reconstruction and As surfactant effects on MBE-grown GaN epilayers

被引:9
作者
Okumura, H
Hamaguch, H
Ohta, K
Feuillet, G
Balakrishnan, K
Ishida, Y
Chichibu, S
Nakanishi, H
Nagatomo, T
Yoshida, S
机构
[1] Electrotech Lab, Tsukuba, Ibaraki 305, Japan
[2] Sci Univ Tokyo, Chiba 278, Japan
[3] Shibaura Inst Technol, Minato Ku, Tokyo 108, Japan
[4] CEA, Ctr Grenoble, F-38041 Grenoble 9, France
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
GaN; MBE; surface reconstruction; surfactant; growth optimization; cubic;
D O I
10.4028/www.scientific.net/MSF.264-268.1167
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface reconstructions and their transitions have been examined for MBE grown GaN surfaces. Several types of reconstructions and their transitions were observed depending on growth condition, crystal structure etc. It is shown that the surface reconstruction phase diagram and its phase transition line are useful for the optimization of MBE growth of GaN. Little amount of As-4 residual pressure was found to affect the structure of GaN growing surfaces. These As surfactant effects are discussed and the growth of cubic GaN under small amount of As-4 pressure is reported.
引用
收藏
页码:1167 / 1172
页数:6
相关论文
共 13 条
[1]   SURFACE RECONSTRUCTIONS OF ZINCBLENDE GAN/GAAS(001) IN PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY [J].
BRANDT, O ;
YANG, H ;
JENICHEN, B ;
SUZUKI, Y ;
DAWERITZ, L ;
PLOOG, KH .
PHYSICAL REVIEW B, 1995, 52 (04) :R2253-R2256
[2]  
CHO SH, 1995, JPN J APPL PHYS, V34, P236
[3]   Arsenic mediated reconstructions on cubic (001) GaN [J].
Feuillet, G ;
Hamaguchi, H ;
Ohta, K ;
Hacke, P ;
Okumura, H ;
Yoshida, S .
APPLIED PHYSICS LETTERS, 1997, 70 (08) :1025-1027
[4]  
FEUILLET G, 1997, MATER RES SOC SYMP P, V449, P257
[5]   Monitoring surface stoichiometry with the (2x2) reconstruction during growth of hexagonal-phase GaN by molecular beam epitaxy [J].
Hacke, P ;
Feuillet, G ;
Okumura, H ;
Yoshida, S .
APPLIED PHYSICS LETTERS, 1996, 69 (17) :2507-2509
[6]  
Maruyama T, 1996, INST PHYS CONF SER, V142, P851
[7]  
Nakamura S., 1997, BLUE LASER DIODE GAN
[8]  
Okumura H, 1997, MATER RES SOC SYMP P, V449, P435
[9]   Observation of MBE-grown cubic-GaN/GaAs and cubic-GaN/3C-SiC interfaces by high resolution transmission electron microscope [J].
Okumura, H ;
Ohta, K ;
Nagatomo, T ;
Yoshida, S .
JOURNAL OF CRYSTAL GROWTH, 1996, 164 (1-4) :149-153
[10]   Growth and characterization of cubic GaN [J].
Okumura, H ;
Ohta, K ;
Feuillet, G ;
Balakrishnan, K ;
Chichibu, S ;
Hamaguchi, H ;
Hacke, P ;
Yoshida, S .
JOURNAL OF CRYSTAL GROWTH, 1997, 178 (1-2) :113-133