Interpolation in the Directed Assembly of Block Copolymers on Nanopatterned Substrates: Simulation and Experiments

被引:131
作者
Detcheverry, Francois A. [1 ]
Liu, Guoliang [1 ]
Nealey, Paul F. [1 ]
de Pablo, Juan J. [1 ]
机构
[1] Univ Wisconsin, Dept Chem & Biol Engn, Madison, WI 53706 USA
基金
美国国家科学基金会;
关键词
THIN-FILMS; DIBLOCK COPOLYMERS; SURFACES; ARRAYS;
D O I
10.1021/ma902332h
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
A combined theoretical and experimental approach is used to study the directed assembly of a lamellae-forming block copolymer on chemically patterned substrates. The period of the pattern is lower than that of the copolymer, whose characteristic morphology is then used to interpolate the features of the substrate. The pattern considered in this study consists of stripes of width W repeated over the background substrate with period L-P = 2L(0), where L-0 is the copolymer natural period. The stripe and background areas are characterized by their affinities Lambda(s) and Lambda(b) for the blocks of the polymer. Using theoretically informed Monte Carlo simulations of a coarse-grained model, we investigate in a systematic manner the influence of the pattern parameters W, Lambda(s), and Lambda(b) on the morphology of copolymer thin films. Thermodynamic integration is used to compute the free energy difference and the relative stability of competing morphologies. It is found that the parameter space considered here is dominated by nonbulk and often metastable morphologies. The conditions that yield successful interpolation of lamellae are identified. Consistent with theoretical predictions, experiments on patterned substrates with carefully controlled interfacial characteristics reveal new, three-dimensional morphologies that do not arise in the bulk. The sought-after vertical lamellae, which are desirable for pattern interpolation and lithography, are found to occur only when the interaction between one of the blocks and the background area is relatively weak.
引用
收藏
页码:3446 / 3454
页数:9
相关论文
共 19 条
[1]   Ordering polymer blend morphologies via solvent evaporation [J].
Buxton, G. A. ;
Clarke, N. .
EPL, 2007, 78 (05)
[2]   Dense self-assembly on sparse chemical patterns: Rectifying and multiplying lithographic patterns using block copolymers [J].
Cheng, Joy Y. ;
Rettner, Charles T. ;
Sanders, Daniel P. ;
Kim, Ho-Cheol ;
Hinsberg, William D. .
ADVANCED MATERIALS, 2008, 20 (16) :3155-3158
[3]   Fabrication of complex three-dimensional nanostructures from self-assembling block copolymer materials on two-dimensional chemically patterned templates with mismatched symmetry -: art. no. 036104 [J].
Daoulas, KC ;
Müller, M ;
Stoykovich, MP ;
Park, SM ;
Papakonstantopoulos, YJ ;
de Pablo, JJ ;
Nealey, PF ;
Solak, HH .
PHYSICAL REVIEW LETTERS, 2006, 96 (03)
[4]   Directed assembly of copolymer materials on patterned substrates:: Balance of simple symmetries in complex structures [J].
Daoulas, Kostas Ch. ;
Mueller, Marcus ;
Stoykovich, Mark P. ;
Papakonstantopoulos, Yioryos J. ;
De Pablo, Juan J. ;
Nealey, Paul F. ;
Park, Sang-Min ;
Solak, Harun H. .
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2006, 44 (18) :2589-2604
[5]   Monte Carlo simulations of a coarse grain model for block copolymers and nanocomposites [J].
Detcheverry, Francois A. ;
Kang, Huiman ;
Daoulas, Kostas Ch. ;
Mueller, Marcus ;
Nealey, Paul F. ;
de Pablo, Juan J. .
MACROMOLECULES, 2008, 41 (13) :4989-5001
[6]   Monte Carlo Simulation of Coarse Grain Polymeric Systems [J].
Detcheverry, Francois A. ;
Pike, Darin Q. ;
Nealey, Paul F. ;
Mueller, Marcus ;
de Pablo, Juan J. .
PHYSICAL REVIEW LETTERS, 2009, 102 (19)
[7]   Mechanism and kinetics of ordering in diblock copolymer thin films on chemically nanopatterned substrates [J].
Edwards, EW ;
Stoykovich, MP ;
Müller, M ;
Solak, HH ;
De Pablo, JJ ;
Nealey, PF .
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 2005, 43 (23) :3444-3459
[8]  
Fredrickson G. H., 2006, International Series of Monographs on Physics, V134
[9]   Defect structure in thin films of a lamellar block copolymer self-assembled on neutral homogeneous and chemically nanopatterned surfaces [J].
Kim, Sang Ouk ;
Kim, Bong Hoon ;
Kim, Kwanghyon ;
Koo, Chong Min ;
Stoykovich, Mark P. ;
Nealey, Paul F. ;
Solak, Harun H. .
MACROMOLECULES, 2006, 39 (16) :5466-5470
[10]  
Lin ZQ, 2002, ADV MATER, V14, P1373, DOI 10.1002/1521-4095(20021002)14:19<1373::AID-ADMA1373>3.0.CO