Identification of VH in silicon by EPR

被引:6
作者
Johannesen, P [1 ]
Byberg, JR
Nielsen, BB
Stallinga, P
Nielsen, KB
机构
[1] Aarhus Univ, Inst Phys & Astron, DK-8000 Aarhus C, Denmark
[2] Aarhus Univ, Inst Chem, DK-8000 Aarhus C, Denmark
来源
DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 | 1997年 / 258-2卷
关键词
silicon; vacancies; hydrogen; dangling bonds; EPR; point defects; electronic properties;
D O I
10.4028/www.scientific.net/MSF.258-263.515
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Floatzone grown silicon crystals have been implanted with protons or deuterons. Electron Paramagnetic Resonance (EPR) spectra show the presence of a strongly temperature dependent signal in addition to the well-known S1 signal. The temperature dependent signal displays monoclinic-I symmetry below 65 K and trigonal symmetry above 110 K. The g- and Si-29 hyperfine tensors are characteristic of defects with the unpaired electron confined mostly to a dangling bond orbital in a vacancy-type defect. The signal shows splittings arising from the hyperfine interaction with a single proton. On this basis, and from the close similarity with the familiar VPO signal (the E-center), we conclude that the signal originates from VHO, the neutral charge state of the silicon monovacancy containing a single hydrogen atom.
引用
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页码:515 / 520
页数:6
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