Wide-bandgap semiconductor ultraviolet photodetectors

被引:1187
作者
Monroy, E
Omnès, F
Calle, F
机构
[1] CEA, SP2M, Dept Rech Fondamentale Mat condensee, F-38054 Grenoble, France
[2] CNRS, Ctr Rech Heteroepitaxie & Applicat, F-06560 Valbonne, France
[3] Univ Politecn Madrid, ISOM, Madrid 28040, Spain
[4] Univ Politecn Madrid, Dpto Ingn Elect, Madrid 28040, Spain
关键词
D O I
10.1088/0268-1242/18/4/201
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Industries such as the automotive, aerospace or military, as well as environmental and biological research have promoted the development of ultraviolet (UV) photodetectors capable of operating at high temperatures and in hostile environments. UV-enhanced Si photodiodes are hence giving way to a new generation of UV detectors fabricated from wide-bandgap semiconductors, such as SiC, diamond, Ill-nitrides, ZnS, ZnO, or ZnSe. This paper provides a general review of latest progresses in wide-bandgap semiconductor photodetectors.
引用
收藏
页码:R33 / R51
页数:19
相关论文
共 190 条
  • [1] Demonstration of blue-ultraviolet avalanche photo-diodes of II-VI wide bandgap compounds grown by MBE
    Abe, T
    Ishikura, H
    Fukuda, N
    Aung, ZM
    Adachi, M
    Kasada, H
    Ando, K
    [J]. JOURNAL OF CRYSTAL GROWTH, 2000, 214 : 1134 - 1137
  • [2] SiO2-passivated lateral-geometry GaN transparent Schottky-barrier detectors
    Adivarahan, V
    Simin, G
    Yang, JW
    Lunev, A
    Khan, MA
    Pala, N
    Shur, M
    Gaska, R
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (06) : 863 - 865
  • [3] [Anonymous], 1995, INFRARED PHOTON DETE
  • [4] Electrical characteristics of Schottky contacts on GaN and Al0.11Ga0.89N
    Arulkumaran, S
    Egawa, T
    Zhao, GY
    Ishikawa, H
    Jimbo, T
    Umeno, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2000, 39 (4B): : L351 - L353
  • [5] PHOTOELECTRIC-EMISSION FROM NEGATIVE-ELECTRON-AFFINITY DIAMOND(111) SURFACES - EXCITON BREAKUP VERSUS CONDUCTION-BAND EMISSION
    BANDIS, C
    PATE, BB
    [J]. PHYSICAL REVIEW B, 1995, 52 (16) : 12056 - 12071
  • [6] Electron affinity and Schottky barrier height of metal-diamond (100), (111), and (110) interfaces
    Baumann, PK
    Nemanich, RJ
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 83 (04) : 2072 - 2082
  • [7] BEARDIE G, 1997, APPL PHYS LETT, V71, P1092
  • [8] Bhattacharya P., 1994, SEMICONDUCTOR OPTOEL
  • [9] Properties of a photovoltaic detector based on an n-type GaN Schottky barrier
    Binet, F
    Duboz, JY
    Laurent, N
    Rosencher, E
    Briot, O
    Aulombard, RL
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) : 6449 - 6454
  • [10] Mechanisms of recombination in GaN photodetectors
    Binet, F
    Duboz, JY
    Rosencher, E
    Scholz, F
    Harle, V
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (09) : 1202 - 1204