Effects of crystallographic orientations on the charging time in silicon nanocrystal flash memories

被引:16
作者
de Sousa, JS
Leburton, JP
Thean, AV
Freire, VN
da Silva, EF
机构
[1] Univ Illinois, Urbana, IL 61801 USA
[2] Motorola Inc, Austin, TX 78727 USA
[3] Univ Fed Ceara, Dept Fis, BR-60455760 Fortaleza, Ceara, Brazil
[4] Univ Fed Pernambuco, Dept Fis, BR-50670901 Recife, PE, Brazil
关键词
D O I
10.1063/1.1566479
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of crystallographic orientations in nanocrystal silicon on the charging time of flash memory devices is investigated by using the Bardeen's transfer formalism within a Schrodinger-Poisson scheme. Besides the strong dependence on the nanocrystal shape, we found that the crystallographic orientations strongly affect the electronic structure by changing the symmetry of the wave functions and level degeneracy, which can result in variation in the charging time by one order of magnitude. (C) 2003 American Institute of Physics.
引用
收藏
页码:2685 / 2687
页数:3
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