Nanometer definition of atomic beams with masks of light

被引:54
作者
Abfalterer, R
Keller, C
Bernet, S
Oberthaler, MK
Schmiedmayer, J
Zeilinger, A
机构
[1] Universitat-Innsbruck, Innsbruck
来源
PHYSICAL REVIEW A | 1997年 / 56卷 / 06期
关键词
D O I
10.1103/PhysRevA.56.R4365
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We build amplitude, i.e., absorptive masks, for neutral atoms using light, reversing the roles of light and atoms as compared to conventional optics. These masks can be used both to create and to probe spatially well-defined atomic distributions. The resolution of these masks can be significantly better than the optical wavelength. Applications range from atom lithography to fundamental atom optical experiments. [S1050-2947(97)50412-4].
引用
收藏
页码:R4365 / R4368
页数:4
相关论文
共 27 条
[11]   FOURIER IMAGES .3. FINITE SOURCES [J].
COWLEY, JM ;
MOODIE, AF .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05) :505-&
[12]   Atom lithography using light forces [J].
Drodofsky, U ;
Drewsen, M ;
Pfau, T ;
Nowack, S ;
Mlynek, J .
MICROELECTRONIC ENGINEERING, 1996, 30 (1-4) :383-386
[13]   Raman-induced avoided crossings in adiabatic optical potentials: Observation of lambda/8 spatial frequency in the distribution of atoms [J].
Gupta, R ;
McClelland, JJ ;
Marte, P ;
Celotta, RJ .
PHYSICAL REVIEW LETTERS, 1996, 76 (25) :4689-4692
[14]   NANOFABRICATION OF A 2-DIMENSIONAL ARRAY USING LASER-FOCUSED ATOMIC DEPOSITION [J].
GUPTA, R ;
MCCLELLAND, JJ ;
JABBOUR, ZJ ;
CELOTTA, RJ .
APPLIED PHYSICS LETTERS, 1995, 67 (10) :1378-1380
[15]   Using neutral metastable argon atoms and contamination lithography to form nanostructures in silicon, silicon dioxide, and gold [J].
Johnson, KS ;
Berggren, KK ;
Black, A ;
Black, CT ;
Chu, AP ;
Dekker, NH ;
Ralph, DC ;
Thywissen, JH ;
Younkin, R ;
Tinkham, M ;
Prentiss, M ;
Whitesides, GM .
APPLIED PHYSICS LETTERS, 1996, 69 (18) :2773-2775
[16]   ATOMIC VELOCITY SELECTION USING STIMULATED RAMAN TRANSITIONS [J].
KASEVICH, M ;
WEISS, DS ;
RIIS, E ;
MOLER, K ;
KASAPI, S ;
CHU, S .
PHYSICAL REVIEW LETTERS, 1991, 66 (18) :2297-2300
[17]   AN INTERFEROMETER FOR ATOMS [J].
KEITH, DW ;
EKSTROM, CR ;
TURCHETTE, QA ;
PRITCHARD, DE .
PHYSICAL REVIEW LETTERS, 1991, 66 (21) :2693-2696
[18]  
Kreis M, 1996, APPL PHYS B-LASERS O, V63, P649
[19]   Diffraction of atoms from a measurement induced grating [J].
Kunze, S ;
Dieckmann, K ;
Rempe, G .
PHYSICAL REVIEW LETTERS, 1997, 78 (11) :2038-2041
[20]  
MARTIN PJ, 1988, PHYS REV LETT, V60, P515, DOI 10.1103/PhysRevLett.60.515