Electronic properties of the 2D-hole accumulation layer on hydrogen terminated diamond

被引:65
作者
Nebel, CE
Rezek, B
Zrenner, A
机构
[1] Natl Inst Adv Ind Sci & Technol, Diamond Res Ctr, Tsukuba, Ibaraki 3058568, Japan
[2] Univ Paderborn, Dept Phys, D-33089 Paderborn, Germany
关键词
H-terminated diamond; theoretical calculations; electronic density of states;
D O I
10.1016/j.diamond.2004.06.028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Hydrogen-tenninated diamond films have been investigated by Contact Potential Difference Measurements (CPD or Kelvin force), Hall effect experiments and theoretical calculations where the Schrodinger and Poisson equations have been solved to calculate the density of state (DOS) distribution at the surface of hydrogen-terminated diamond. From CPD experiments, we detect the Fermi energy to be about 700-meV deep in the valence band. This is in agreement with results from numerical calculations, where Fermi energies in the range 240-880 meV below the valence band maximum at the surface are deduced. The calculations show that a two-dimensional (2D) density of state is present at the surface. Temperature-dependent hole sheet densities and mobilities are used to discuss the properties of the 2D-DOS. From this data, we conclude that the 2D-DOS is distorted by disorder arising from nonperfect hydrogen termination of the surface, by surface roughness, and/or by ionic molecules, which are part of the adsorbate layer. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:2031 / 2036
页数:6
相关论文
共 22 条
[1]   ELECTRICAL-PROPERTIES OF HYDROGENATED DIAMOND [J].
ALBIN, S ;
WATKINS, L .
APPLIED PHYSICS LETTERS, 1990, 56 (15) :1454-1456
[2]   Formation of dipole-oriented water films on mica substrates at ambient conditions [J].
Bluhm, H ;
Inoue, T ;
Salmeron, M .
SURFACE SCIENCE, 2000, 462 (1-3) :L599-L602
[3]   FORMATION MECHANISM OF P-TYPE SURFACE CONDUCTIVE LAYER ON DEPOSITED DIAMOND FILMS [J].
GI, RS ;
MIZUMASA, T ;
AKIBA, Y ;
HIROSE, Y ;
KUROSU, T ;
IIDA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (10) :5550-5555
[4]  
Gi RS, 1999, JPN J APPL PHYS 1, V38, P3492
[5]   Study of the effect of hydrogen on transport properties in chemical vapor deposited diamond films by Hall measurements [J].
Hayashi, K ;
Yamanaka, S ;
Okushi, H ;
Kajimura, K .
APPLIED PHYSICS LETTERS, 1996, 68 (03) :376-378
[6]   Hydrogen-terminated diamond surfaces and interfaces [J].
Kawarada, H .
SURFACE SCIENCE REPORTS, 1996, 26 (07) :205-259
[7]   ELECTRICAL-PROPERTIES OF SCHOTTKY-BARRIER FORMED ON AS-GROWN AND OXIDIZED SURFACE OF HOMOEPITAXIALLY GROWN DIAMOND(001) FILM [J].
KIYOTA, H ;
MATSUSHIMA, E ;
SATO, K ;
OKUSHI, H ;
ANDO, T ;
KAMO, M ;
SATO, Y ;
LIDA, M .
APPLIED PHYSICS LETTERS, 1995, 67 (24) :3596-3598
[8]   RESISTIVITY OF CHEMICAL VAPOR-DEPOSITED DIAMOND FILMS [J].
LANDSTRASS, MI ;
RAVI, KV .
APPLIED PHYSICS LETTERS, 1989, 55 (10) :975-977
[9]   High carrier mobility in polycrystalline thin film diamond [J].
Looi, HJ ;
Jackman, RB ;
Foord, JS .
APPLIED PHYSICS LETTERS, 1998, 72 (03) :353-355
[10]   Origin of surface conductivity in diamond [J].
Maier, F ;
Riedel, M ;
Mantel, B ;
Ristein, J ;
Ley, L .
PHYSICAL REVIEW LETTERS, 2000, 85 (16) :3472-3475