Band structure nonlocal pseudopotential calculation of the III-nitride wurtzite phase materials system.: Part II.: Ternary alloys AlxGa1-xN, InxGa1-xN, and InxAl1-xN

被引:86
作者
Goano, M
Bellotti, E
Ghillino, E
Garetto, C
Ghione, G
Brennan, KF
机构
[1] Politecn Torino, Dipartimento Elettron, I-10129 Turin, Italy
[2] Georgia Inst Technol, Microelect Res Ctr, Atlanta, GA 30332 USA
关键词
D O I
10.1063/1.1309047
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work presents detailed information on the band structures of the III-nitride wurtzite ternary alloys, computed through the virtual crystal approximation approach. The key ingredient of this study is the set of realistic atomic effective potentials described in Part I of the present work, dedicated to the constituent binary compounds. The model relies on the linear interpolation of the structural parameters and of the local and nonlocal effective potentials: no further empirical corrections are included. The dependence on the mole fraction is computed for the energy gaps at all the high-symmetry points, the valence-band width, and the electron effective masses in the valleys relevant for carrier-transport simulation. (C) 2000 American Institute of Physics. [S0021-8979(00)08520-0].
引用
收藏
页码:6476 / 6482
页数:7
相关论文
共 70 条
  • [1] GROWTH OF INXGA1-XN AND INXAL1-XN ON GAAS METALORGANIC MOLECULAR-BEAM EPITAXY
    ABERNATHY, CR
    MACKENZIE, JD
    BHARATAN, SR
    JONES, KS
    PEARTON, SJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03): : 716 - 718
  • [2] Ab initio calculation of electronic properties of Ga1-xAlxN alloys
    Agrawal, BK
    Agrawal, S
    Yadav, PS
    Kumar, S
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1997, 9 (08) : 1763 - 1775
  • [3] ELECTRONIC-STRUCTURE AND EQUILIBRIUM PROPERTIES OF GAXAL1-XN ALLOYS
    ALBANESI, EA
    LAMBRECHT, WRL
    SEGALL, B
    [J]. PHYSICAL REVIEW B, 1993, 48 (24): : 17841 - 17847
  • [4] Growth and applications of Group III nitrides
    Ambacher, O
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (20) : 2653 - 2710
  • [5] Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1-xN films
    Angerer, H
    Brunner, D
    Freudenberg, F
    Ambacher, O
    Stutzmann, M
    Hopler, R
    Metzger, T
    Born, E
    Dollinger, G
    Bergmaier, A
    Karsch, S
    Korner, HJ
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (11) : 1504 - 1506
  • [6] [Anonymous], 1997, BLUE LASER DIODE GAN, DOI DOI 10.1007/978-3-662-03462-0
  • [7] [Anonymous], 1991, SEMICONDUCTORS
  • [8] Evidence for compositional inhomogeneity in low In content (InGa)N obtained by resonant Raman scattering
    Behr, D
    Wagner, J
    Ramakrishnan, A
    Obloh, H
    Bachem, KH
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (02) : 241 - 243
  • [9] BRENNAN KF, 2000, GAN RELATED MAT, V2, P305
  • [10] Optical constants of epitaxial AlGaN films and their temperature dependence
    Brunner, D
    Angerer, H
    Bustarret, E
    Freudenberg, F
    Hopler, R
    Dimitrov, R
    Ambacher, O
    Stutzmann, M
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 82 (10) : 5090 - 5096