Nanoscale polarization relaxation kinetics in polycrystalline ferroelectric thin films

被引：7

作者：

Anbusathaiah, V. ^{[1
]}

Nagarajan, V.

Aggarwal, S.

机构：

[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

[2] Texas Instruments Inc, Dallas, TX 75243 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2007年 / 101卷 / 08期

关键词：

D O I：

10.1063/1.2715489

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the nanoscale kinetics of ferroelectric domain wall motion in polycrystalline ferroelectric thin films. High-resolution piezoresponse force microscopy is employed to investigate the changes that occur at the domain wall surface during the polarization relaxation process. 50x50 nm(2) domain images reveal that domain wall motion is a very jerky process. The domain wall motion shows two distinct cycles-one where it breaks into several segments to advance, following which it recombines to form a continuous surface. This "pinning-depinning" cycle continues throughout the relaxation process. A kinetic model based on the concept of domain wall mobility and a thermodynamic driving force is developed to explain this jagged motion. (c) American Institute of Physics.

引用

页数：6

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