Optical losses in porous silicon waveguides in the near-infrared: Effects of scattering

被引：45

作者：

Ferrand, P ^{[1
]}

Romestain, R ^{[1
]}

机构：

[1] Univ Grenoble 1, Spectrometrie Phys Lab, CNRS, UMR 5588, F-38402 St Martin Dheres, France

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 22期

关键词：

D O I：

10.1063/1.1329161

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Benefitting from the long path inside planar waveguides, we have investigated the optical losses of porous silicon, in the continuous 0.8-1.6 mum (0.77-1.55 eV) range. The obtained values, typically a few cm(-1), are 1 order of magnitude larger than "pure" absorption losses measured previously. The other main sources of loss, including scattering on both interface roughness and nanocrystallites, are invoked. Calculations give the same order of magnitude as measurements. We also detected scattered light close to the direct beam. (C) 2000 American Institute of Physics. [S0003-6951(00)03548-8].

引用

页码：3535 / 3537

页数：3

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