Smoothing and coherent structure formation in organic-organic heterostructure growth

被引：25

作者：

Hinderhofer, A. ^{[1
]}

Gerlach, A. ^{[1
]}

Kowarik, S. ^{[1
,2
]}

Zontone, F. ^{[3
]}

Krug, J. ^{[4
]}

Schreiber, F. ^{[1
]}

机构：

[1] Univ Tubingen, Inst Angew Phys, D-72076 Tubingen, Germany

[2] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA

[3] European Synchrotron Radiat Facil, F-38043 Grenoble 9, France

[4] Univ Cologne, Inst Theoret Phys, D-50937 Cologne, Germany

来源：

EPL | 2010年 / 91卷 / 05期

关键词：

THIN-FILMS; ROUGHNESS; DYNAMICS; ORDER;

D O I：

10.1209/0295-5075/91/56002

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We use in situ real-time X-ray reflectivity and complementary atomic force microscopy to monitor crystallinity and roughness evolution during growth of organic heterostructures, i.e. perfluoropentacene (PFP) on diindenoperylene (DIP) and pentacene (PEN) on PFP. For both systems, surface smoothing during thermal evaporation of the second material on top of the first is observed. The smoothing can be rationalized by a, compared to homoepitaxy, lowered step edge barrier for one species diffusing on the other. In addition, we find an exceptionally well-ordered interface for PEN-on-PFP growth and PEN growth with anomalously low roughening, along with coherent scattering over the entire thickness. Copyright (C) EPLA, 2010

引用

页数：5

共 23 条

[1]

[Anonymous], 2004, ISLAND MOUNDS ATOMS, DOI DOI 10.1007/978-3-642-18672-1

[2] Nonmonotonic roughness evolution in unstable growth [J].

Castellano, C ;

Krug, J .

PHYSICAL REVIEW B, 2000, 62 (04) :2879-2888

[3] Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors [J].

Constantoudis, V ;

Patsis, GP ;

Tserepi, A ;

Gogolides, E .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (03) :1019-1026

[4] Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene) -: art. no. 016104 [J].

Dürr, AC ;

Schreiber, F ;

Ritley, KA ;

Kruppa, V ;

Krug, J ;

Dosch, H ;

Struth, B .

PHYSICAL REVIEW LETTERS, 2003, 90 (01) :4

[5] High structural order in thin films of the organic semiconductor diindenoperylene [J].

Dürr, AC ;

Schreiber, F ;

Münch, M ;

Karl, N ;

Krause, B ;

Kruppa, V ;

Dosch, H .

APPLIED PHYSICS LETTERS, 2002, 81 (12) :2276-2278

[6] Ehrlich-Schwoebel effect for organic molecules: Direct calculation of the step-edge barrier using empirical potentials [J].

Fendrich, M. ;

Krug, J. .

PHYSICAL REVIEW B, 2007, 76 (12)

[7] Unstable growth on rough surfaces [J].

Gyure, MF ;

Zinck, JJ ;

Ratsch, C ;

Vvedensky, DD .

PHYSICAL REVIEW LETTERS, 1998, 81 (22) :4931-4934

[8] Growth dynamics of pentacene thin films [J].

Heringdorf, FJMZ ;

Reuter, MC ;

Tromp, RM .

NATURE, 2001, 412 (6846) :517-520

[9] Optical properties of pentacene and perfluoropentacene thin films [J].

Hinderhofer, Alexander ;

Heinemeyer, Ute ;

Gerlach, Alexander ;

Kowarik, Stefan ;

Jacobs, Robert M. J. ;

Sakamoto, Youichi ;

Suzuki, Toshiyasu ;

Schreiber, Frank .

JOURNAL OF CHEMICAL PHYSICS, 2007, 127 (19)

[10] Characterization of step-edge barriers in organic thin-film growth [J].

Hlawacek, Gregor ;

Puschnig, Peter ;

Frank, Paul ;

Winkler, Adolf ;

Ambrosch-Draxl, Claudia ;

Teichert, Christian .

SCIENCE, 2008, 321 (5885) :108-111

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