Spectroscopic evidence for the tricapped trigonal prism structure of semiconductor clusters

被引:86
作者
Müller, J [1 ]
Liu, B
Shvartsburg, AA
Ogut, S
Chelikowsky, JR
Siu, KWM
Ho, KM
Gantefor, G
机构
[1] Univ Konstanz, Fachbereich Phys, D-78457 Constance, Germany
[2] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[3] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA
[4] York Univ, Dept Chem, N York, ON M3J 1P3, Canada
[5] York Univ, Ctr Res Mass Spect, N York, ON M3J 1P3, Canada
[6] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
关键词
D O I
10.1103/PhysRevLett.85.1666
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have obtained photoelectron spectra (PES) for silicon cluster anions with up to 20 atoms. Efficient cooling of species in the source has allowed us to resolve multiple features in the PES fur all sizes studied. Spectra for an extensive set of low-energy Si-n(-) isomers found by a global search have been simulated using density functional theory and pseudopotentials. Except for n = 12, calculations for Si-n(-) ground states agree with the measurements. This does not hold for other plausible geometries, Hence PES data validate the tricapped trigonal prism morphologies for medium-sized Si clusters.
引用
收藏
页码:1666 / 1669
页数:4
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