Nanoscale surface modification and nanostructural fabrication of YBa2Cu3O7-x thin films by scanning tunneling microscopy

被引:10
作者
Fan, YC [1 ]
Fitzgerald, AG [1 ]
Cairns, JA [1 ]
机构
[1] Univ Dundee, Dept Elect Engn & Phys, Dundee DD1 4HN, Scotland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 05期
关键词
D O I
10.1116/1.1290370
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The scanning tunneling microscope has been used to modify the surface of YBa2Cu3O7-x (YBCO) high T-c. superconducting thin films by operating the instrument in the so-called mechanical milling or field-induced evaporation mode. Nanostructures such as holes, lines, and trenches were fabricated on the YBCO thin film surface in a controlled manner. In the surface modification and nanostructure fabrication processes, the effect of bias voltage, tunneling current, and scanning feedback control parameters on the modification efficiency have been investigated. (C) 2000 American Vacuum Society. [S0734-211X(00)03205-4].
引用
收藏
页码:2377 / 2383
页数:7
相关论文
共 19 条
[1]   Modification of YBa2Cu3O7-δ wires using a scanning tunneling microscope:: Process and electrical transport effects [J].
Bertsche, G ;
Clauss, W ;
Prins, FE ;
Kern, DP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06) :3883-3886
[2]   Nanometer-scale surface modifications of YBa2Cu3O7-delta thin films using a scanning tunneling microscope [J].
Bertsche, G ;
Clauss, W ;
Kern, DP .
APPLIED PHYSICS LETTERS, 1996, 68 (25) :3632-3634
[3]   Investigation of the modification mechanism induced by a scanning tunneling microscope on YBa2Cu3O7-δ [J].
Bertsche, G ;
Clauss, W ;
Prins, FE ;
Kern, DP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (05) :2833-2836
[4]   Scanning probe nanostructuring of YBa2Cu3O7:: A corrosion induced abrasion [J].
Boneberg, J ;
Bohmisch, M ;
Ochmann, M ;
Leiderer, P .
APPLIED PHYSICS LETTERS, 1997, 71 (26) :3805-3807
[5]   Application of scanning probe methods for electronic and magnetic device fabrication, characterization, and testing [J].
Born, A ;
Hahn, C ;
Lohndorf, M ;
Wadas, A ;
Witt, C ;
Wiesendanger, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06) :3625-3631
[6]   SURFACE MODIFICATION DURING SCANNING TUNNELING MICROSCOPE MEASUREMENTS ON YBA2CU3O7 THIN-FILMS [J].
GEYER, U ;
VONMINNIGERODE, G ;
KREBS, HU .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (12) :7774-7777
[7]   SCANNING TUNNELING MICROSCOPY OF THE SURFACE-TOPOGRAPHY AND SURFACE ETCHING OF NANOSCALE STRUCTURES ON THE HIGH-TEMPERATURE SUPERCONDUCTORS [J].
HARMER, MA ;
FINCHER, CR ;
PARKINSON, BA .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (05) :2760-2763
[8]   ETCHING OF SCREW DISLOCATIONS IN YBA2CU3O7 FILMS WITH A SCANNING TUNNELING MICROSCOPE [J].
HEYVAERT, I ;
OSQUIGUIL, E ;
VANHAESENDONCK, C ;
BRUYNSERAEDE, Y .
APPLIED PHYSICS LETTERS, 1992, 61 (01) :111-113
[9]  
JOHNSON SE, 1997, I PHYS C SER, V135, P437
[10]   SURFACE MODIFICATION MECHANISM OF MATERIALS WITH SCANNING TUNNELING MICROSCOPE [J].
KONDO, S ;
HEIKE, S ;
LUTWYCHE, M ;
WADA, Y .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (01) :155-160