Comparison between epi-down and epi-up bonded high-power single-mode 980-nm semiconductor lasers

被引:31
作者
Liu, XS [1 ]
Hu, MH [1 ]
Nguyen, HK [1 ]
Caneau, CG [1 ]
Rasmussen, MH [1 ]
Davis, RW [1 ]
Zah, CE [1 ]
机构
[1] Corning Inc, Corning, NY 14831 USA
来源
IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2004年 / 27卷 / 04期
关键词
epi-down bonding; pump laser; semiconductor laser; reliability; thermal management; thermal stress;
D O I
10.1109/TADVP.2004.831862
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epi-down and epi-up bonded high-power single-mode 980-nm lasers has been studied in terms of bonding process, thermal behavior, optical performances, and long-term laser reliability. We demonstrated that epi-down bonding can offer lower thermal resistance and improved optical performance without degrading the long-term laser reliability. An optical power of 630 mW was obtained for the first time from an epi-down bonded 980-nm pump module. Our studies have shown that epi-down bonding of single-mode 980-nm lasers can reduce junction temperature and thermal resistance by up to 30%. Experimental measurements showed over 20% in thermal rollover power improvement and over 25% reduction in wavelength shift versus current in epi-down mounted lasers compared to epi-up mounted lasers. Lifetime test over 14000 h at 500 mA and 80 degreesC of the epi-down bonded lasers is reported for the first time.
引用
收藏
页码:640 / 646
页数:7
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