SOME ASPECTS OF BONDING-SOLDER DETERIORATION OBSERVED IN LONG-LIVED SEMICONDUCTOR-LASERS - SOLDER MIGRATION AND WHISKER GROWTH

被引：41

作者：

MIZUISHI, K

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1984年 / 55卷 / 02期

关键词：

D O I：

10.1063/1.333095

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：289 / 295

页数：7

共 26 条

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