Structural study of lanthanum nickelate thin films deposited on different single crystal substrates

被引：13

作者：

Faucheux, V ^{[1
]}

Pignard, S ^{[1
]}

Audier, M ^{[1
]}

机构：

[1] INPG, CNRS, UMR 5628, LMGP,ENSPG INPG, FR-38402 St Martin Dheres, France

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 2004年 / 177卷 / 12期

关键词：

Ruddlesden-Popper oxide; metalorganic chemical vapor deposition; transmission electron microscopy; X-ray diffraction;

D O I：

10.1016/j.jssc.2004.10.016

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

Fabrications of La2NiO4+delta thin film layers by liquid-injection metalorganic chemical vapor deposition were tried on different single crystals substrates: (001)Si, (001)MgO, (001)LaAlO3 and (001)SrTiO3. As results of structural characterizations, polycrystalline dendritic layers of La2NiO4+delta tetragonal (or orthorhombic) phase were observed on (001)Si substrates while layers of a perovskite-like cubic structure were observed on the other single crystal substrates. From a high-resolution TEM study of a layer deposited on (001)MgO, such a perovskite-like cubic structure exhibits many planar structural faults likely similar to planes of oxygen vacancies of the La(2)Nio(4+delta) orthorhombic structure. A thin intermediate epitaxial layer of NiO phase was also identified. Using a X-ray texture diffractometer, the layer structure on (001)MgO, (001)LaAlO3 and (001)SrTiO3 was confirmed to be of cubic structure with <100> axes parallel to those of the substrate. The T dependence of the resistivity of a layer deposited on (001)MgO substrate was found to be of a semi-conducting behavior. (C) 2004 Elsevier Inc. All rights reserved.

引用

页码：4616 / 4625

页数：10

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