A compact multipurpose nanomanipulator for use inside a scanning electron microscope

被引:26
作者
Heeres, E. C. [1 ]
Katan, A. J. [1 ]
van Es, M. H. [1 ]
Beker, A. F. [1 ]
Hesselberth, M. [1 ]
van der Zalm, D. J. [1 ]
Oosterkamp, T. H. [1 ,2 ]
机构
[1] Leiden Univ, Leiden Inst Phys, NL-2333 CA Leiden, Netherlands
[2] Leiden Probe Microscopy, NL-2333 CA Leiden, Netherlands
关键词
etching; manipulators; nanotechnology; scanning electron microscopes; scanning probe microscopy; welding; NANOTUBES; BEAM;
D O I
10.1063/1.3271033
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A compact, two-stage nanomanipulator was designed and built for use inside a scanning electron microscope. It consists of a fine stage employing piezostacks that provide a 15 mu m range in three dimensions and a coarse stage based on commercially available stick-slip motors. Besides the fabrication of enhanced probes for scanning probe microscopy and the enhancement of electron field emitters, other novel manipulation processes were developed, such as locating, picking up, and positioning small nanostructures with an accuracy of similar to 10 nm. In combination with in situ I-V experiments, welding, and etching, this results in a multipurpose nanofactory, enabling a new range of experiments.
引用
收藏
页数:4
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共 15 条
[1]   Electrothermal microgrippers for pick-and-place operations [J].
Andersen, Karin. N. ;
Carlson, Kenneth ;
Petersen, Dirch H. ;
Molhave, Kristian ;
Eichhorn, Volkmar ;
Fatikow, Sergej ;
Boggild, Peter .
MICROELECTRONIC ENGINEERING, 2008, 85 (5-6) :1128-1130
[2]   Rapid imaging of nanotubes on insulating substrates [J].
Brintlinger, T ;
Chen, YF ;
Dürkop, T ;
Cobas, E ;
Fuhrer, MS ;
Barry, JD ;
Melngailis, J .
APPLIED PHYSICS LETTERS, 2002, 81 (13) :2454-2456
[3]   Nanotubes as nanoprobes in scanning probe microscopy [J].
Dai, HJ ;
Hafner, JH ;
Rinzler, AG ;
Colbert, DT ;
Smalley, RE .
NATURE, 1996, 384 (6605) :147-150
[4]   Controlled mounting of individual multiwalled carbon nanotubes on support tips [J].
de Jonge, N ;
Lamy, Y ;
Kaiser, M .
NANO LETTERS, 2003, 3 (12) :1621-1624
[5]   High brightness electron beam from a multi-walled carbon nanotube [J].
de Jonge, N ;
Lamy, Y ;
Schoots, K ;
Oosterkamp, TH .
NATURE, 2002, 420 (6914) :393-395
[6]   Crossed nanotube junctions [J].
Fuhrer, MS ;
Nygård, J ;
Shih, L ;
Forero, M ;
Yoon, YG ;
Mazzoni, MSC ;
Choi, HJ ;
Ihm, J ;
Louie, SG ;
Zettl, A ;
McEuen, PL .
SCIENCE, 2000, 288 (5465) :494-497
[7]  
HEERES EC, UNPUB
[8]   Electron emission from individual indium arsenide semiconductor nanowires [J].
Heeres, Erwin C. ;
Bakkers, Erik P. A. M. ;
Roest, Aarnoud L. ;
Kaiser, Monja ;
Oosterkamp, Tjerk H. ;
de Jonge, Niels .
NANO LETTERS, 2007, 7 (02) :536-540
[9]   Measuring hydrophobic interactions with three-dimensional nanometer resolution [J].
Katan, Allard J. ;
Oosterkamp, Tjerk H. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2008, 112 (26) :9769-9776
[10]   Slip-stick step-scanner for scanning probe microscopy [J].
Meyer, C ;
Sqalli, O ;
Lorenz, H ;
Karrai, K .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (06)