Microcrystallography with an X-ray waveguide

被引：47

作者：

Müller, M

Burghammer, M

Flot, D

Riekel, C

Morawe, C

Murphy, B

Cedola, A

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] CLRC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England

[3] Ist Elettr Stato Solido, I-00156 Rome, Italy

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2000年 / 33卷

关键词：

D O I：

10.1107/S0021889800009249

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A waveguide microdiffraction setup is described for an undulator beamline at the European Synchrotron Radiation Facility. The composite optics consists of a waveguide, which confines the beam vertically, and a horizontally focusing multilayer mirror. A beam size of about 0.1 x 3 mu m (vertical x horizontal) at lambda = 0.095 nm has been obtained. The sample stage comprises a three-axis gantry with micrometre precision and a three-axis piezo-scanner with about 0.1 mu m repeatability. Diffraction experiments are demonstrated for selected inorganic and polymeric samples. Possibilities for scanning diffractometry and small-angle scattering experiments are discussed.

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页码：1231 / 1240

页数：10

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