Growth and characterization of BSTO/hexaferrite composite thin films

被引:10
作者
Hajndl, R
Sanders, J
Srikanth, H [1 ]
Dudney, NJ
机构
[1] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
[2] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
关键词
D O I
10.1063/1.1543129
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferroelectric/ferrite composite films are excellent systems in which the electromagnetic material properties can be tuned through changes in composition as well as microstructure. We report on our studies of the structural and magnetic properties of Ba0.5Sr0.5TiO3/BaFe12O19 (BSTO/BaM) composite thin films deposited on Al2O3 substrates using magnetron sputtering. Optimizing the sputtering conditions and postdeposition annealing lead to high-quality films without any impurity phases. Magnetic measurements yield saturation magnetization values in the range of 100 to 200 emu/cm(3). Hysteresis loops exhibit a double transition that is observed only in the composite films and not in pure hexaferrite films grown under identical deposition conditions. The unusual feature in the M-H data is ascribed to the possibility of magnetodielectric effects associated with intergranular magnetic coupling mediated by the BSTO polarization layer. (C) 2003 American Institute of Physics.
引用
收藏
页码:7999 / 8001
页数:3
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