Easy-to-use unglued tip replacement near-field optical microscope with piezoelectric shear force detection

被引：6

作者：

Mulin, D ^{[1
]}

Vannier, C ^{[1
]}

Bainier, C ^{[1
]}

Courjon, D ^{[1
]}

Spajer, M ^{[1
]}

机构：

[1] Univ Franche Comte, UFR Sci & Tech, Inst Microtech Franche Comte, Lab Opt PM Duffieux,CNRS,UMR 6603,FRW 0067, F-25030 Besancon, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 09期

关键词：

D O I：

10.1063/1.1287632

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new nonoptical shear force detection for scanning near-field optical microscopes is proposed in this article. Its main characteristic is a simple and fast tip replacement. The probe is mechanically in contact with a piezoelectric plate of a homemade tuning fork, ensuring a direct coupling and avoiding the fiber tip gluing. (C) 2000 American Institute of Physics. [S0034-6748(00)03009-4].

引用

页码：3441 / 3443

页数：3

共 9 条

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