Multiple-step triangular-pattern phase shifting and the influence of number of steps and pitch on measurement accuracy

被引:41
作者
Jia, Peirong [1 ]
Kofman, Jonathan
English, Chad
机构
[1] Univ Laval, Comp Vis & Syst Lab, Dept Elect & Comp Engn, Quebec City, PQ G1K 7P4, Canada
[2] Univ Ottawa, Dept Mech Engn, Ottawa, ON K1N 6N5, Canada
[3] Univ Waterloo, Dept Syst Design Engn, Waterloo, ON N2L 3G1, Canada
[4] Neptec Design Grp Ltd, Kanata, ON K2K 1Y5, Canada
关键词
D O I
10.1364/AO.46.003253
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present new extensions of the two-step, triangular-pattern phase-shifting method for different numbers of phase-shifting steps to increase measurement accuracy and to analyze the influence of the number of phase-shifting steps and pitch of the projected triangular intensity-profile pattern on the measurement accuracy. Phase-shifting algorithms to generate the intensity ratio, essential for surface reconstruction, were developed for each measurement method. Experiments determined that higher measurement accuracy can be obtained with a greater number of phase-shifting steps and a lower value of pitch, as long as the pitch is appropriately selected to be divisible by the number of phase-shifting steps and not below an optimal value, where intensity-ratio unwrapping failure would occur. (c) 2007 Optical Society of America.
引用
收藏
页码:3253 / 3262
页数:10
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