High energy implantation by ion projection

被引:12
作者
Meijer, J [1 ]
Stephan, A [1 ]
机构
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
关键词
D O I
10.1016/S0167-9317(98)00059-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new type of ion projector is proposed to structurize a wafer at a resolution below 200 nm reducing the typically used lithography steps to a large extent. Basically, this technique aims to project a mask onto a wafer using an ion optical lens system allowing a demagnification up to 1:50 for ions with energies between 100 keV and some MeV. The center piece of this device is a single magnetic lens consisting of a superconducting solenoid. The achievable lateral resolution depends on lens errors, stability of the stencil mask and straggling of the implanted ions. A variation of the implantation energy would allow three dimensional structurization.
引用
收藏
页码:257 / 260
页数:4
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