High photoresponsivity of a p-channel InGaP/GaAs/InGaAs double heterojunction pseudomorphic modulation-doped field effect transistor

被引:13
作者
Kim, HJ [1 ]
Kim, DM
Woo, DH
Kim, SI
Kim, SH
Lee, JI
Kang, KN
Cho, K
机构
[1] Korea Inst Sci & Technol, Div Elect & Informat Technol, Seoul 130650, South Korea
[2] Kookmin Univ, Sch Elect Engn, Seoul 136702, South Korea
[3] Sogang Univ, Dept Phys, Seoul 100611, South Korea
关键词
D O I
10.1063/1.120813
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, we report the electrical and optical characteristics of p-channel In0.13Ga0.87As double heterojunction pseudomorphic modulation-doped field effect transistor (MODFET) structure grown by gas source molecular beam epitaxy. The Hall mobility and the density of 2-DHGs (two-dimensional hole gases) in the pseudomorphic In0.13Ga0.87As channel were measured to be 250 cm(2)/V s and 1.9 x 10(12) cm(-2) at 300 K, and 5800 cm(2)/V s and 1.5 x 10(12) cm(-2) at 23 K, respectively. The fabricated p-channel MODFET shows a good mobility property which is due to high valence band discontinuity of InGaP/GaAs/InGaAs double barriers. The peak energy in the photoluminescence spectrum from the p-channel pseudomorphic MODFET structure was found to be 1.4 eV (lambda=881 nm). The photoresponsivity with this modified pseudomorphic MODFET structure shows outstandingly better than that of a pin photodiode, particularly at low incident optical power. (C) 1998 American Institute of Physics.
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页码:584 / 586
页数:3
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