High-resolution complex structures for two-dimensional photonic crystals realized by x-ray diffraction lithography

被引:7
作者
Businaro, L
Romanato, F
Candeloro, P
Di Fabrizio, E
Patrini, M
Galli, M
Andreani, C
Passaseo, A
De Vittorio, M
机构
[1] INFM, LILIT Lab, I-34017 Trieste, Italy
[2] Univ Pavia, Dipartimento Fis A Volta, I-27100 Pavia, Italy
[3] Univ Lecce, Natl Nanotechnol Lab, INFM, I-73100 Lecce, Italy
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 02期
关键词
D O I
10.1116/1.1547726
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two-dimensional photonic band gap structures were fabricated by x-ray lithography combined with, ion etching on metalorganic chemical vapor deposition grown GaAs/AlGaAs waveguides. Such structures, more amenable to fabrication than fully three-dimensional photonic crystals, allow the confinement of light in the third direction using index guiding. The feasibility of complex high-resolution (down to 50 nm) unit cell fabrication has been demonstrated by exploiting x-ray diffraction and nonlinear resist response during the development process. Optical characterizations of some samples were performed. These characterizations show the presence of well-defined photonic band gap structures and second harmonic property generation. The results have been discussed and compared with theoretical simulation. (C) 2003 American Vacuum Society.
引用
收藏
页码:748 / 753
页数:6
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