Shear modulation force microscopy study of near surface glass transition temperatures

被引:251
作者
Ge, S [1 ]
Pu, Y
Zhang, W
Rafailovich, M
Sokolov, J
Buenviaje, C
Buckmaster, R
Overney, RM
机构
[1] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
[2] Univ Washington, Dept Chem Engn, Seattle, WA 98195 USA
关键词
D O I
10.1103/PhysRevLett.85.2340
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report results of glass transition (T-x) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T-g of thin (17-500 nm) polymer Films and found that T-g is independent of film thickness (t > 17 nm), strength of substrate interactions, or even presence of substrate.
引用
收藏
页码:2340 / 2343
页数:4
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