Effects of AFM-based nanomachining process on aluminum surface

被引:113
作者
Fang, TH
Chang, WJ
机构
[1] Kung Shan Inst Technol, Dept Engn Mech, Tainan 71016, Taiwan
[2] Natl Cheng Kung Univ, Dept Mech Engn, Tainan 70101, Taiwan
关键词
metals; surfaces; mechanical properties; surface properties; ATOMIC-FORCE MICROSCOPE; LITHOGRAPHY; SIMULATION;
D O I
10.1016/S0022-3697(02)00436-5
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Surface analysis of nanomachined material is studied by atomic force microscopy (AFM). To understand the influence of different machined conditions on surface characterization, several nanomachining experiments are performed. Multiple furrows are conducted on a silicon substrate coated with aluminum films under the four different applied loads, including 4, 8, 12, 16 muN. Results indicate that the average surface roughness and the root-mean-square roughness of nanometer-scale surface are improved after the nanomachining process. It can be seen that a smoother surface is obtained under an applied load of 12 muN, and it implies that the surface roughness of the case is minimum in all tests. The same result can also be seen in the fractal dimension analysis. In addition, the bulge edge effect on the nanomachining process is obvious after several scribing cycles. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:913 / 918
页数:6
相关论文
共 12 条
[1]  
[Anonymous], 1977, FRACTAL GEOMETRY NAT
[2]  
BHUSHAN B, 1995, HDB MICRO NANO TRIBO
[3]   Machining characterization of the nano-lithography process using atomic force microscopy [J].
Fang, TH ;
Weng, CI ;
Chang, JG .
NANOTECHNOLOGY, 2000, 11 (03) :181-187
[4]   Simulation of asperity plowing in an atomic force microscope Part I: Experimental and theoretical methods [J].
Hector, LG ;
Schmid, SR .
WEAR, 1998, 215 (1-2) :247-256
[5]   Fabrication of silicon and metal nanowires and dots using mechanical atomic force lithography [J].
Hu, S ;
Hamidi, A ;
Altmeyer, S ;
Koster, T ;
Spangenberg, B ;
Kurz, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (05) :2822-2824
[6]  
Kunze U, 1999, ADV MATER, V11, P1473, DOI 10.1002/(SICI)1521-4095(199912)11:17<1473::AID-ADMA1473>3.0.CO
[7]  
2-H
[8]   Fractal-based description for the three-dimensional surface of materials [J].
Li, JM ;
Lu, L ;
Su, Y ;
Lai, MO .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (05) :2526-2532
[9]  
Miyoshi K., 1993, SURFACE DIAGNOSTICS
[10]   Atomic force microscopy lithography as a nanodevice development technique [J].
Notargiacomo, A ;
Foglietti, V ;
Cianci, E ;
Capellini, G ;
Adami, M ;
Faraci, P ;
Evangelisti, F ;
Nicolini, C .
NANOTECHNOLOGY, 1999, 10 (04) :458-463