Parallel maskless optical lithography for prototyping, low-volume production, and research

被引:23
作者
Gil, D
Menon, R
Tang, XD
Smith, HI
Carter, DJD
机构
[1] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
[2] MIT, Elect Res Lab, Cambridge, MA 02139 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2002年 / 20卷 / 06期
关键词
D O I
10.1116/1.1526353
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Earlier we reported on a proof-of-concept maskless-lithography system that used an array of Fresnel zone plates to focus multiple beams of 442 nm light onto a substrate, and micromechanics for multiplexing light to the several zone plates, enabling patterns of arbitrary geometry, at 350 nm linewidth, to be written. We referred to the technique as zone-plate-array lithography (ZPAL). We also demonstrated zone-plate-array microscopy. Here, we report on a "preprototype" ZPAL system operating at an exposure wavelength of 400 nm, capable of quick-turn-around, maskless lithography. We describe the lithography results with this system as well the development of high-speed data delivery systems, high-numerical-aperture zone plates (up to 0.95), and a multiplexing scheme that will enable us to move to a "full-prototype" system capable of 210 nm feature sizes at a moderate but useful throughput of similar to0.25 cm(2) in 20 min. (C) 2002 American Vacuum Society.
引用
收藏
页码:2597 / 2601
页数:5
相关论文
共 9 条
[1]   The future of the microprocessor business [J].
Bass, MJ ;
Christensen, CM .
IEEE SPECTRUM, 2002, 39 (04) :34-+
[2]   Maskless, parallel patterning with zone-plate array lithography [J].
Carter, DJD ;
Gil, D ;
Menon, R ;
Mondol, MK ;
Smith, HI ;
Anderson, EH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06) :3449-3452
[3]   Towards realization of an atomic de Broglie microscope:: Helium atom focusing using fresnel zone plates [J].
Doak, RB ;
Grisenti, RE ;
Rehbein, S ;
Schmahl, G ;
Toennies, JP ;
Wöll, C .
PHYSICAL REVIEW LETTERS, 1999, 83 (21) :4229-4232
[4]   SPATIAL-PHASE-LOCKED ELECTRON-BEAM LITHOGRAPHY - INITIAL TEST-RESULTS [J].
FERRERA, J ;
WONG, VV ;
RISHTON, S ;
BOEGLI, V ;
ANDERSON, EH ;
KERN, DP ;
SMITH, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06) :2342-2345
[5]   Lithographic patterning and confocal imaging with zone plates [J].
Gil, D ;
Menon, R ;
Carter, DJD ;
Smith, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :2881-2885
[6]   Spatial-phase-locked electron-beam lithography with a delay-locked loop [J].
Goodberlet, J ;
Ferrera, J ;
Smith, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06) :2293-2297
[7]   A NEW MASK LITHOGRAPHY TOOL FOR ADVANCED MASK MANUFACTURING [J].
GRENON, BJ ;
HAMAKER, HC ;
BUCK, PD .
MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) :225-230
[8]  
HASTINGS JT, IN PRESS J VAC SCI B
[9]   A proposal for maskless, zone-plate-array nanolithography [J].
Smith, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06) :4318-4322