Basic electroanalytical characterization of lithium insertion into thin, well-crystallized V2O5 films

被引:63
作者
Lu, Z [1 ]
Levi, MD [1 ]
Salitra, G [1 ]
Gofer, Y [1 ]
Levi, E [1 ]
Aurbach, D [1 ]
机构
[1] Bar Ilan Univ, Dept Chem, IL-52900 Ramat Gan, Israel
基金
以色列科学基金会;
关键词
lithium insertion; V2O5; films; cyclic voltammetry;
D O I
10.1016/S0022-0728(00)00184-4
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Slow-scan rate cyclic voltammetry (SSCV), potentiostatic intermittent titration (PITT) and electrochemical impedance spectroscopy (EIS) have been applied simultaneously to study Li ion intercalation into V2O5 films prepared by evaporative vacuum-deposition on Pt foils. Two different films, 1600 and 3600 Angstrom thick, were used to study the influence of the film's thickness on the major electroanalytical characteristics of these intercalation electrodes. Modeling of the impedance spectrum related to the thin V2O5 film was performed using an equivalent circuit analog including the following elements: three R parallel to C semicircles (covering the high-frequency domain) and finite-length Warburg in sequence with the intercalation capacity (a straight line of unit slope at intermediate frequencies, and a sloping capacitive line at the very low frequencies). Sharp minima on D versus E plots, which are observed in the vicinity of the cyclic voltammetric peaks, present further evidence of very high, attractive electron-ion interactions during Li ion intercalation into the V2O5 electrode, as was already described for similar processes in graphite and some transition metal oxides: LixCoO2 LixNiO2, LixCoyNi1-yO2, and LixMn2O4. The diffusion length in these electrodes related to the V2O5 film's thickness. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:211 / 221
页数:11
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